Dahoo, Pierre Richard.
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami. - London : Hoboken : ISTE Ltd. ; Wiley 2021. - 1 online resource - Mechanical engineering and solid mechanics series Reliability of multiphysical systems set ; v. 9 . - Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ; v. 9. .
Includes bibliographical references and index.
Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.
9781119808244 1119808243 9781119808220 1119808227
Metrology.
Metrology.
Electronic books.
QC88
389/.1
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami. - London : Hoboken : ISTE Ltd. ; Wiley 2021. - 1 online resource - Mechanical engineering and solid mechanics series Reliability of multiphysical systems set ; v. 9 . - Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ; v. 9. .
Includes bibliographical references and index.
Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.
9781119808244 1119808243 9781119808220 1119808227
Metrology.
Metrology.
Electronic books.
QC88
389/.1