Kelly, Thomas F.,
Atomic-scale analytical tomography : concepts and implications / Thomas F. Kelly, Brian P. Gorman, Simon P. Ringer. - 1 online resource (xxii, 240 pages) : digital, PDF file(s). - Advances in microscopy and microanalysis . - Advances in microscopy and microanalysis. .
Title from publisher's bibliographic system (viewed on 04 Mar 2022).
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
9781316677292 (ebook)
Tomography.
Transmission electron microscopy.
Atom-probe field ion microscopy.
RC78.7.T6 / K45 2022
616.07572
Atomic-scale analytical tomography : concepts and implications / Thomas F. Kelly, Brian P. Gorman, Simon P. Ringer. - 1 online resource (xxii, 240 pages) : digital, PDF file(s). - Advances in microscopy and microanalysis . - Advances in microscopy and microanalysis. .
Title from publisher's bibliographic system (viewed on 04 Mar 2022).
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
9781316677292 (ebook)
Tomography.
Transmission electron microscopy.
Atom-probe field ion microscopy.
RC78.7.T6 / K45 2022
616.07572