Mendoza-Santoyo Fernando,
Full field optical metrology and applications / Fernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�ia del Socorro Hern�andez-Montes and Jorge Mauricio Flores Moreno. - 1 online resource (various pagings) : illustrations (some color). - [IOP release $release] IOP series in advances in optics, photonics and optoelectronics IOP ebooks. [2022 collection] . - IOP (Series). Release 22. IOP series in advances in optics, photonics and optoelectronics. IOP ebooks. 2022 collection. .
"Version: 20221201"--Title page verso.
Includes bibliographical references.
1. Foundations of optical interferometry -- 1.1. Light waves -- 1.2. Types of interferometers -- 1.3. Interference of light waves -- 1.4. Multiple wave interference -- 1.5. White-light interferometry -- 1.6. Holographic interferometry 2. Coherence -- 2.1. Introduction : the background -- 2.2. Basic principles of coherence -- 2.3. Temporal coherence -- 2.4. Partial coherence -- 2.5. Spatial coherence 3. Phase retrieval -- 3.1. Phase sampling evaluation -- 3.2. Modern methods for phase retrieval -- 3.3. Interference phase demodulation 4. Laser speckle metrology -- 4.1. Basics for laser speckle metrology -- 4.2. Laser speckle measurements 5. Moir�e interferometry -- 5.1. Introduction -- 5.2. Moir�e pattern formulation -- 5.3. Moir�e pattern alignment -- 5.4. Shape detection via the moir�e pattern 6. Holography -- 6.1. Digital holographic interferometry 7. Digital speckle pattern interferometry (DSPI) -- 7.1. Background -- 7.2. DSPI technique -- 7.3. The sensitivity vector, the displacement vector, and the optical phase difference -- 7.4. In-plane and out-of-plane sensitive set-ups -- 7.5. Phase-stepping interferometry -- 7.6. Vibration modes obtained with DSPI 8. 3D digital holographic interferometry -- 8.1. Principle -- 8.2. Illuminating once at a time -- 8.3. Illuminating at the same time (simultaneously) -- 8.4. Strain measurement using DHI -- 8.5. Deformation in 3D measurements -- 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example 9. Digital holographic microscopy for surface profilometry -- 9.1. Introduction -- 9.2. Digital holographic microscopy -- 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy -- 9.4. Digital holography using low coherence sources 10. Contouring -- 10.1. Two points of object illumination -- 10.2. Two-wavelength contouring -- 10.3. Contouring from experimental data 11. Optical coherence tomography -- 11.1. OCT configurations -- 11.2. Optical phase in spectral OCT -- 11.3. Examples of depth-resolved phase measurement 12. Digital image correlation -- 12.1. A brief introduction to digital image correlation -- 12.2. Two-dimensional digital image correlation -- 12.3. Three-dimensional digital image correlation 13. Speckle-noise reduction in optical techniques by non-local means methods -- 13.1. Introduction -- 13.2. Non-local means methods -- 13.3. Examples 14. Overview of recent applications using DHI -- 14.1. Introduction -- 14.2. Basic applications of DHI 15. A couple of trending applications related to holography -- 15.1. Electron holographic interferometry -- 15.2. Quantum holography.
This book introduces non-contact optical techniques based on the speckle effect in more detail.
Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full field speckle-based metrology.
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
Fernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, M�exico, where he was the founder of the Optical Metrology Division in 1991.
9780750330275 9780750330268
10.1088/978-0-7503-3027-5 doi
Optical measurements.
Metrology.
Optical physics.
SCIENCE / Physics / Optics & Light.
QC367 / .M464 2022eb
681/.25
Full field optical metrology and applications / Fernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�ia del Socorro Hern�andez-Montes and Jorge Mauricio Flores Moreno. - 1 online resource (various pagings) : illustrations (some color). - [IOP release $release] IOP series in advances in optics, photonics and optoelectronics IOP ebooks. [2022 collection] . - IOP (Series). Release 22. IOP series in advances in optics, photonics and optoelectronics. IOP ebooks. 2022 collection. .
"Version: 20221201"--Title page verso.
Includes bibliographical references.
1. Foundations of optical interferometry -- 1.1. Light waves -- 1.2. Types of interferometers -- 1.3. Interference of light waves -- 1.4. Multiple wave interference -- 1.5. White-light interferometry -- 1.6. Holographic interferometry 2. Coherence -- 2.1. Introduction : the background -- 2.2. Basic principles of coherence -- 2.3. Temporal coherence -- 2.4. Partial coherence -- 2.5. Spatial coherence 3. Phase retrieval -- 3.1. Phase sampling evaluation -- 3.2. Modern methods for phase retrieval -- 3.3. Interference phase demodulation 4. Laser speckle metrology -- 4.1. Basics for laser speckle metrology -- 4.2. Laser speckle measurements 5. Moir�e interferometry -- 5.1. Introduction -- 5.2. Moir�e pattern formulation -- 5.3. Moir�e pattern alignment -- 5.4. Shape detection via the moir�e pattern 6. Holography -- 6.1. Digital holographic interferometry 7. Digital speckle pattern interferometry (DSPI) -- 7.1. Background -- 7.2. DSPI technique -- 7.3. The sensitivity vector, the displacement vector, and the optical phase difference -- 7.4. In-plane and out-of-plane sensitive set-ups -- 7.5. Phase-stepping interferometry -- 7.6. Vibration modes obtained with DSPI 8. 3D digital holographic interferometry -- 8.1. Principle -- 8.2. Illuminating once at a time -- 8.3. Illuminating at the same time (simultaneously) -- 8.4. Strain measurement using DHI -- 8.5. Deformation in 3D measurements -- 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example 9. Digital holographic microscopy for surface profilometry -- 9.1. Introduction -- 9.2. Digital holographic microscopy -- 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy -- 9.4. Digital holography using low coherence sources 10. Contouring -- 10.1. Two points of object illumination -- 10.2. Two-wavelength contouring -- 10.3. Contouring from experimental data 11. Optical coherence tomography -- 11.1. OCT configurations -- 11.2. Optical phase in spectral OCT -- 11.3. Examples of depth-resolved phase measurement 12. Digital image correlation -- 12.1. A brief introduction to digital image correlation -- 12.2. Two-dimensional digital image correlation -- 12.3. Three-dimensional digital image correlation 13. Speckle-noise reduction in optical techniques by non-local means methods -- 13.1. Introduction -- 13.2. Non-local means methods -- 13.3. Examples 14. Overview of recent applications using DHI -- 14.1. Introduction -- 14.2. Basic applications of DHI 15. A couple of trending applications related to holography -- 15.1. Electron holographic interferometry -- 15.2. Quantum holography.
This book introduces non-contact optical techniques based on the speckle effect in more detail.
Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full field speckle-based metrology.
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
Fernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, M�exico, where he was the founder of the Optical Metrology Division in 1991.
9780750330275 9780750330268
10.1088/978-0-7503-3027-5 doi
Optical measurements.
Metrology.
Optical physics.
SCIENCE / Physics / Optics & Light.
QC367 / .M464 2022eb
681/.25