Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods (Record no. 51705)

000 -LEADER
fixed length control field 03717nam a22004815i 4500
001 - CONTROL NUMBER
control field 978-1-4471-5185-2
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200420220218.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130616s2013 xxk| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781447151852
-- 978-1-4471-5185-2
082 04 - CLASSIFICATION NUMBER
Call Number 006.3
100 1# - AUTHOR NAME
Author Aldrich, Chris.
245 10 - TITLE STATEMENT
Title Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods
300 ## - PHYSICAL DESCRIPTION
Number of Pages XIX, 374 p. 208 illus., 151 illus. in color.
490 1# - SERIES STATEMENT
Series statement Advances in Computer Vision and Pattern Recognition,
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Overview of Process Fault Diagnosis -- Artificial Neural Networks -- Statistical Learning Theory and Kernel-Based Methods -- Tree-Based Methods -- Fault Diagnosis in Steady State Process Systems -- Dynamic Process Monitoring -- Process Monitoring Using Multiscale Methods.
520 ## - SUMMARY, ETC.
Summary, etc Algorithms for intelligent fault diagnosis of automated operations offer significant benefits to the manufacturing and process industries. Furthermore, machine learning methods enable such monitoring systems to handle nonlinearities and large volumes of data. This unique text/reference describes in detail the latest advances in Unsupervised Process Monitoring and Fault Diagnosis with Machine Learning Methods. Abundant case studies throughout the text demonstrate the efficacy of each method in real-world settings. The broad coverage examines such cutting-edge topics as the use of information theory to enhance unsupervised learning in tree-based methods, the extension of kernel methods to multiple kernel learning for feature extraction from data, and the incremental training of multilayer perceptrons to construct deep architectures for enhanced data projections. Topics and features: Reviews the application of machine learning to process monitoring and fault diagnosis Discusses machine learning frameworks based on artificial neural networks, statistical learning theory and kernel-based methods, and tree-based methods Examines the application of machine learning to steady state and dynamic operations, with a focus on unsupervised learning Describes the use of spectral methods in process fault diagnosis This highly practical and clearly-structured work is an invaluable resource for all researchers and practitioners involved in process control, multivariate statistics and machine learning. Dr. Chris Aldrich is a Professor in the Department of Metallurgical and Minerals Engineering at Curtin University, Perth, Australia. Dr. Lidia Auret is a Lecturer in the Department of Process Engineering at Stellenbosch University, South Africa.
700 1# - AUTHOR 2
Author 2 Auret, Lidia.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4471-5185-2
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- London :
-- Springer London :
-- Imprint: Springer,
-- 2013.
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-- text
-- txt
-- rdacontent
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-- computer
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-- rdamedia
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-- online resource
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-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer science.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Artificial intelligence.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer Science.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Artificial Intelligence (incl. Robotics).
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
-- 2191-6586
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-- ZDB-2-SCS

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