Electrothermal Frequency References in Standard CMOS (Record no. 52031)

000 -LEADER
fixed length control field 03269nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-1-4614-6473-0
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200420220223.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130402s2013 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781461464730
-- 978-1-4614-6473-0
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
100 1# - AUTHOR NAME
Author Kashmiri, S. Mahdi.
245 10 - TITLE STATEMENT
Title Electrothermal Frequency References in Standard CMOS
300 ## - PHYSICAL DESCRIPTION
Number of Pages IX, 214 p.
490 1# - SERIES STATEMENT
Series statement Analog Circuits and Signal Processing
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Silicon-based Frequency References -- Frequency References  Based on the Thermal Properties of Silicon.-A Digitally-Assisted Electrothermal Frequency-Locked Loop in Standard CMOS -- An Electrothermal Frequency Reference in Standard 0.7µm CMOS -- A Scaled Electrothermal Frequency Reference in Standard 0.16µm CMOS -- Conclusions and Outlook -- Appendix.
520 ## - SUMMARY, ETC.
Summary, etc This book describes an alternative method of accurate on-chip frequency generation in standard CMOS IC processes. This method exploits the thermal-diffusivity of silicon, the rate at which heat diffuses through a silicon substrate.  This is the first book describing thermal-diffusivity-based frequency references, including the complete theoretical methodology supported by practical realizations that prove the feasibility of the method.  Coverage also includes several circuit and system-level solutions for the analog electronic circuit design challenges faced.   �         Surveys the state-of-the-art in all-silicon frequency references; �         Examines the thermal properties of silicon as a solution for the challenge of on-chip accurate frequency generation; �         Uses simplified modeling approaches that allow an electronics engineer easily to simulate the electrothermal elements; �         Follows a top-down methodology in circuit design, in which system-level design is promoted by behavioral simulations.
700 1# - AUTHOR 2
Author 2 Makinwa, Kofi A. A.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-6473-0
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2013.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microelectronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Signal, Image and Speech Processing.
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-- ZDB-2-ENG

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