Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide (Record no. 56446)

000 -LEADER
fixed length control field 03701nam a22005175i 4500
001 - CONTROL NUMBER
control field 978-1-4614-2269-3
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200421112037.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 121009s2013 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781461422693
-- 978-1-4614-2269-3
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
100 1# - AUTHOR NAME
Author McConaghy, Trent.
245 10 - TITLE STATEMENT
Title Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Sub Title A Hands-on Field Guide /
300 ## - PHYSICAL DESCRIPTION
Number of Pages XVI, 188 p.
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Fast PTV Verification and Design -- Pictoral Primer on Probablilities -- 3-Sigma Verification and Design -- High-Sigma Verification and Design -- Variation-Aware Design -- Conclusion.
520 ## - SUMMARY, ETC.
Summary, etc This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.   Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows. Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable. Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation. Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification. Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications. Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3(Sv(B statistical and high-sigma statistical design.
700 1# - AUTHOR 2
Author 2 Breen, Kristopher.
700 1# - AUTHOR 2
Author 2 Dyck, Jeffrey.
700 1# - AUTHOR 2
Author 2 Gupta, Amit.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-2269-3
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2013.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microelectronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology and Microengineering.
912 ## -
-- ZDB-2-ENG

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