Design, Analysis and Test of Logic Circuits Under Uncertainty (Record no. 57266)

000 -LEADER
fixed length control field 03642nam a22005895i 4500
001 - CONTROL NUMBER
control field 978-90-481-9644-9
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200421112052.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120921s2013 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9789048196449
-- 978-90-481-9644-9
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
100 1# - AUTHOR NAME
Author Krishnaswamy, Smita.
245 10 - TITLE STATEMENT
Title Design, Analysis and Test of Logic Circuits Under Uncertainty
300 ## - PHYSICAL DESCRIPTION
Number of Pages XII, 124 p.
490 1# - SERIES STATEMENT
Series statement Lecture Notes in Electrical Engineering,
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Probabilistic Transfer Matrices -- Computing with Probabilistic Transfer Matrices -- Testing Logic Circuits for Probabilistic Faults -- Signtaure-based Reliability Analysis -- Design for Robustness -- Summary and Extensions.
520 ## - SUMMARY, ETC.
Summary, etc Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:   • Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;   • Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;   • Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;   • Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
General subdivision Reusability.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
General subdivision Mathematics.
700 1# - AUTHOR 2
Author 2 Markov, Igor L.
700 1# - AUTHOR 2
Author 2 Hayes, John P.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-90-481-9644-9
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Dordrecht :
-- Springer Netherlands :
-- Imprint: Springer,
-- 2013.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer hardware.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Arithmetic and logic units, Computer.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Logic design.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer software
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer science
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Arithmetic and Logic Structures.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer Hardware.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Performance and Reliability.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Logic Design.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Symbolic and Algebraic Manipulation.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
-- 1876-1100 ;
912 ## -
-- ZDB-2-ENG

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