Trace-Based Post-Silicon Validation for VLSI Circuits (Record no. 57730)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 03591nam a22005055i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-3-319-00533-1 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200421112227.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 130611s2014 gw | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319005331 |
| -- | 978-3-319-00533-1 |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.3815 |
| 100 1# - AUTHOR NAME | |
| Author | Liu, Xiao. |
| 245 10 - TITLE STATEMENT | |
| Title | Trace-Based Post-Silicon Validation for VLSI Circuits |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | XV, 108 p. 59 illus., 38 illus. in color. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Lecture Notes in Electrical Engineering, |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. �         Provides a comprehensive summary of state-of-the-art on post-silicon validation; �         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; �         Illustrate key concepts and algorithms with real examples.        . |
| 700 1# - AUTHOR 2 | |
| Author 2 | Xu, Qiang. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://dx.doi.org/10.1007/978-3-319-00533-1 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Heidelberg : |
| -- | Springer International Publishing : |
| -- | Imprint: Springer, |
| -- | 2014. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Engineering. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Microprocessors. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic circuits. |
| 650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Engineering. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Circuits and Systems. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Processor Architectures. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| -- | 1876-1100 ; |
| 912 ## - | |
| -- | ZDB-2-ENG |
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