On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (Record no. 58319)
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000 -LEADER | |
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fixed length control field | 03269nam a22005295i 4500 |
001 - CONTROL NUMBER | |
control field | 978-3-319-10819-3 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20200421112542.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 150310s2015 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9783319108193 |
-- | 978-3-319-10819-3 |
082 04 - CLASSIFICATION NUMBER | |
Call Number | 621.3815 |
100 1# - AUTHOR NAME | |
Author | Cui, Qiang. |
245 10 - TITLE STATEMENT | |
Title | On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | XVII, 86 p. 59 illus., 42 illus. in color. |
505 0# - FORMATTED CONTENTS NOTE | |
Remark 2 | Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance. |
700 1# - AUTHOR 2 | |
Author 2 | Liou, Juin J. |
700 1# - AUTHOR 2 | |
Author 2 | Hajjar, Jean-Jacques. |
700 1# - AUTHOR 2 | |
Author 2 | Salcedo, Javier. |
700 1# - AUTHOR 2 | |
Author 2 | Zhou, Yuanzhong. |
700 1# - AUTHOR 2 | |
Author 2 | Srivatsan, Parthasarathy. |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://dx.doi.org/10.1007/978-3-319-10819-3 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
264 #1 - | |
-- | Cham : |
-- | Springer International Publishing : |
-- | Imprint: Springer, |
-- | 2015. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
337 ## - | |
-- | computer |
-- | c |
-- | rdamedia |
338 ## - | |
-- | online resource |
-- | cr |
-- | rdacarrier |
347 ## - | |
-- | text file |
-- | |
-- | rda |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Engineering. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronic circuits. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronics. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Microelectronics. |
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Engineering. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Circuits and Systems. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronic Circuits and Devices. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronics and Microelectronics, Instrumentation. |
912 ## - | |
-- | ZDB-2-ENG |
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