On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits (Record no. 58319)

000 -LEADER
fixed length control field 03269nam a22005295i 4500
001 - CONTROL NUMBER
control field 978-3-319-10819-3
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200421112542.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 150310s2015 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783319108193
-- 978-3-319-10819-3
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
100 1# - AUTHOR NAME
Author Cui, Qiang.
245 10 - TITLE STATEMENT
Title On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
300 ## - PHYSICAL DESCRIPTION
Number of Pages XVII, 86 p. 59 illus., 42 illus. in color.
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Basics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
520 ## - SUMMARY, ETC.
Summary, etc This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
700 1# - AUTHOR 2
Author 2 Liou, Juin J.
700 1# - AUTHOR 2
Author 2 Hajjar, Jean-Jacques.
700 1# - AUTHOR 2
Author 2 Salcedo, Javier.
700 1# - AUTHOR 2
Author 2 Zhou, Yuanzhong.
700 1# - AUTHOR 2
Author 2 Srivatsan, Parthasarathy.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-319-10819-3
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2015.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microelectronics.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic Circuits and Devices.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics and Microelectronics, Instrumentation.
912 ## -
-- ZDB-2-ENG

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