Fundamentals of semiconductor manufacturing and process control / (Record no. 59291)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 06141nam a2201165 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5201952 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200421114109.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 151221s2006 njua ob 001 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780471790280 |
| -- | ebook |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | cloth : alk. paper |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | cloth : print |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.3815/2 |
| 100 1# - AUTHOR NAME | |
| Author | May, Gary S., |
| 245 10 - TITLE STATEMENT | |
| Title | Fundamentals of semiconductor manufacturing and process control / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xix, 463 pages) : |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. An Instructor Support FTP site is also available. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Statistical methods. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Spanos, Costas J. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201952 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | [Piscataway, New Jersey] : |
| -- | IEEE, |
| -- | c2006. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [2006] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Process control |
| 695 ## - | |
| -- | Adaptation model |
| 695 ## - | |
| -- | Analysis of variance |
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| -- | Analytical models |
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| -- | Artificial neural networks |
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| -- | Assembly |
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| -- | Circuit faults |
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| -- | Computers |
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| -- | Control charts |
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| -- | Control systems |
| 695 ## - | |
| -- | Data models |
| 695 ## - | |
| -- | Databases |
| 695 ## - | |
| -- | Design methodology |
| 695 ## - | |
| -- | Electrical resistance measurement |
| 695 ## - | |
| -- | Electronics industry |
| 695 ## - | |
| -- | Fabrication |
| 695 ## - | |
| -- | Fault diagnosis |
| 695 ## - | |
| -- | Gaussian distribution |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Integrated circuit modeling |
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| -- | Integrated circuits |
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| -- | Logic gates |
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| -- | Manufacturing |
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| -- | Manufacturing processes |
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| -- | Marketing and sales |
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| -- | Mathematical model |
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| -- | Metals |
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| -- | Monitoring |
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| -- | Optical interferometry |
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| -- | Optical surface waves |
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| -- | Optical variables measurement |
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| -- | Oxidation |
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| -- | Plasma temperature |
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| -- | Pollution measurement |
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| -- | Predictive models |
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| -- | Presses |
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| -- | Principal component analysis |
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| -- | Probability |
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| -- | Probability distribution |
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| -- | Process control |
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| -- | Quality control |
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| -- | Random variables |
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| -- | Real time systems |
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| -- | Response surface methodology |
| 695 ## - | |
| -- | Semiconductor device measurement |
| 695 ## - | |
| -- | Semiconductor device modeling |
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| -- | Semiconductor process modeling |
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| -- | Silicon |
| 695 ## - | |
| -- | Silicon compounds |
| 695 ## - | |
| -- | Statistical analysis |
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| -- | Surface treatment |
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| -- | Temperature control |
| 695 ## - | |
| -- | Testing |
| 695 ## - | |
| -- | Time measurement |
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