Capacitance Spectroscopy of Semiconductors / (Record no. 71454)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 03048cam a2200433Mi 4500 |
| 001 - CONTROL NUMBER | |
| control field | 9781351368452 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220711212518.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180112s2018 flu o 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781315150130 |
| -- | (e-book) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 1315150131 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781351368452 |
| -- | (e-book ; |
| -- | PDF) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 1351368451 |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 535.84 |
| 100 1# - AUTHOR NAME | |
| Author | Lee, Jian V., |
| 245 10 - TITLE STATEMENT | |
| Title | Capacitance Spectroscopy of Semiconductors / |
| 250 ## - EDITION STATEMENT | |
| Edition statement | First edition. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 online resource : |
| 520 2# - SUMMARY, ETC. | |
| Summary, etc | "Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. In the Physics section, we establish the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. In the Instrumentation section, we review the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. In the Applications section, we detail the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. In the Emerging Techniques section, we present the latest advances of capacitance-based electrical characterization aimed at reaching nanometer-scale resolution. This book is the first dedicated treatment of the subject of capacitance spectroscopy of semiconductors. This book caters to an audience with a wide background in materials science, electrical engineering, chemistry, and physics in various career stages from advanced undergraduate- and graduate-level students to professional researchers."--Provided by publisher. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Ferrari, Giorgio, |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://www.taylorfrancis.com/books/9781351368452 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://www.taylorfrancis.com/books/9781315150130 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Boca Raton, FL : |
| -- | CRC Press, |
| -- | 2018. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 588 ## - | |
| -- | OCLC-licensed vendor bibliographic record. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Spectrum analysis. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors. |
| 938 ## - | |
| -- | Taylor & Francis |
| -- | TAFR |
| -- | 9781315150130 |
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