Semiconductor devices in harsh conditions / (Record no. 72305)

000 -LEADER
fixed length control field 01494cam a2200373Ii 4500
001 - CONTROL NUMBER
control field 9781315368948
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 180706t20172017fluad ob 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781315368948
-- (e-book : PDF)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781315332901
-- (e-book: Mobi)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
-- (hardback)
082 04 - CLASSIFICATION NUMBER
Call Number 621.38152
-- S471
245 00 - TITLE STATEMENT
Title Semiconductor devices in harsh conditions /
300 ## - PHYSICAL DESCRIPTION
Number of Pages 1 online resource
490 1# - SERIES STATEMENT
Series statement Devices, circuits, and systems
505 0# - FORMATTED CONTENTS NOTE
Remark 2 section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
General subdivision Reliability.
700 1# - AUTHOR 2
Author 2 Chrzanowska-Jeske, Malgorzata,
700 1# - AUTHOR 2
Author 2 Weide-Zaage, Kirsten,
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://www.taylorfrancis.com/books/9781315368948
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Boca Raton :
-- CRC Press,
-- [2017]
264 #4 -
-- ©2017
336 ## -
-- text
-- rdacontent
337 ## -
-- computer
-- rdamedia
338 ## -
-- online resource
-- rdacarrier
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Semiconductors
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Extreme environments.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Environmental testing.

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