Thermal-aware testing of digital vlsi circuits and systems / (Record no. 72381)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02141cam a2200373Ii 4500 |
| 001 - CONTROL NUMBER | |
| control field | 9781351227780 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180706s2018 fluab ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781351227780 |
| -- | (e-book : PDF) |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.39/50287 |
| 100 1# - AUTHOR NAME | |
| Author | Chattopadhyay, Santanu, |
| 245 10 - TITLE STATEMENT | |
| Title | Thermal-aware testing of digital vlsi circuits and systems / |
| 250 ## - EDITION STATEMENT | |
| Edition statement | First edition. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 online resource (138 pages) : |
| 520 3# - SUMMARY, ETC. | |
| Summary, etc | This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Very large scale integration |
| -- | Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Very large scale integration |
| -- | Thermal properties. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://www.taylorfrancis.com/books/9781351227780 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Boca Raton, FL : |
| -- | CRC Press, an imprint of Taylor and Francis, |
| -- | 2018. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Digital integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Integrated circuits |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Temperature measurements. |
| 650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General. |
| 650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | TECHNOLOGY & ENGINEERING / Electronics / Microelectronics. |
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