Nonvolatile memory technologies with emphasis on Flash : (Record no. 73688)
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000 -LEADER | |
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fixed length control field | 04503nam a2200925 i 4500 |
001 - CONTROL NUMBER | |
control field | 5201541 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20220712205548.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 080327t20152008njua ob 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9780470181355 |
-- | electronic |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
-- | paper |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
-- | electronic |
082 04 - CLASSIFICATION NUMBER | |
Call Number | 004.5 |
245 00 - TITLE STATEMENT | |
Title | Nonvolatile memory technologies with emphasis on Flash : |
Sub Title | a comprehensive guide to understanding and using NVM devices / |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | 1 PDF (xxv, 759 pages) : |
490 1# - SERIES STATEMENT | |
Series statement | IEEE Press series on microelectronic systems ; |
505 0# - FORMATTED CONTENTS NOTE | |
Remark 2 | Introduction to nonvolatile memory / Joe E. Brewer -- Flash memory applications / Gary Forni ... [et. al] -- Memory circuit technologies / Giulio G. Marotta, Giovanni Naso, Giuseppe Savarese -- Physics of flash memories / J. Van Houdt ... [et. al] -- Nor flash stacked and split-gate memory technology / Stephan N. Keeney, Manzur Gill, David Sweetman -- Nand flash memory technology / Koji Sakui, Kang-Deog Suh -- Dinor flash memory technology / Moriyoshi Nakashima, Natsuo Ajika -- P-channel flash memory technology / Frank Ruei-Ling Lin, Charles Ching-Hjsiang Hsu -- Embeddded flash memory / Chang-Kiang (Clinton) Kuo-Min Chang -- Tunnel dielectrics for scaled flash memory cells / T. P. Ma -- Flash memory reliability / Jian Justin Chen, Neal R. Mielke, Chenming Calvin Hu -- Multilevel cell digital memories / Albert Fazio, Mark Bauer -- Alternative memory technologies / Gary F. Derbenwick, Joe E. Brewer. |
520 ## - SUMMARY, ETC. | |
Summary, etc | Presented here is an all-inclusive treatment of Flash technology, including Flash memory chips, Flash embedded in logic, binary cell Flash, and multilevel cell Flash. The book begins with a tutorial of elementary concepts to orient readers who are less familiar with the subject. Next, it covers all aspects and variations of Flash technology at a mature engineering level: basic device structures, principles of operation, related process technologies, circuit design, overall design tradeoffs, device testing, reliability, and applications. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
Subject | Flash memories (Computers) |
700 1# - AUTHOR 2 | |
Author 2 | Brewer, Joe |
700 1# - AUTHOR 2 | |
Author 2 | Gill, Manzur. |
856 42 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201541 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
264 #1 - | |
-- | Piscataway, New Jersey : |
-- | IEEE Press, |
-- | c2008. |
264 #2 - | |
-- | [Piscataqay, New Jersey] : |
-- | IEEE Xplore, |
-- | 2008. |
336 ## - | |
-- | text |
-- | rdacontent |
337 ## - | |
-- | electronic |
-- | isbdmedia |
338 ## - | |
-- | online resource |
-- | rdacarrier |
588 ## - | |
-- | Description based on PDF viewed 12/21/2015. |
695 ## - | |
-- | Arrays |
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-- | Biographies |
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-- | Channel hot electron injection |
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-- | Compaction |
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-- | Computer architecture |
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-- | Degradation |
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-- | Dielectrics |
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-- | EPROM |
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-- | Flash memory |
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-- | Flash memory cells |
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-- | Hot carriers |
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-- | Indexes |
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-- | Insulators |
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-- | Integrated circuit reliability |
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-- | Large scale integration |
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-- | Leakage current |
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-- | Logic devices |
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-- | Logic gates |
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-- | Magnetic cores |
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-- | Memory management |
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-- | Microprocessors |
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-- | Nitrogen |
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-- | Nonvolatile memory |
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-- | Performance evaluation |
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-- | Physics |
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-- | Programming |
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-- | Random access memory |
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-- | Semiconductor memory |
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-- | Silicon |
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-- | Substrates |
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-- | Threshold voltage |
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-- | Transistors |
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-- | Tunneling |
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-- | Voltage control |
No items available.