Electrostatic discharge : (Record no. 74040)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 06588nam a2201213 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5361037 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220712205730.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 091105t20152009njua o 000 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780470495070 |
| -- | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.317 |
| 100 1# - AUTHOR NAME | |
| Author | Mardiguian, Michel, |
| 245 10 - TITLE STATEMENT | |
| Title | Electrostatic discharge : |
| Sub Title | understand, simulate and fix ESD problems / |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 3rd ed. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xii, 299 pages) : |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Preface to the First Edition -- Preface to the Third Edition -- Acknowledgements -- 1. The Electrostatic Discharge Phenomenon -- 1.1. Physics Involved -- 1.2. Influencing Parameters -- 1.3. Various Types of Electrostatic Charging with Humans and Objects -- 1.4. Statistics of Voltages and Currents Reached During ESD -- 1.5. Waveforms of Electrostatic Discharges -- References -- 2. Effects of ESD on Electronics -- 2.1. Direct Discharge to an Electronic Component -- 2.2. Direct Discharge to Electronic Equipment Enclosure -- 2.3. Indirect Discharge -- 2.4. Coupling Mechanisms of ESD Pulse into the Victim's Circuitry -- 2.5. Response of Victim Circuits and Type of Errors -- 2.6. Prediction of Actual ESD-Induced Error, Fast Approximation Method -- 2.7. Remarks on the Actual Current Paths and Associated Radiation -- 2.8. Personnel or Furniture ESD: Which One is Worse? -- References -- 3. Principal ESD Specifications -- 3.1. ESD Test Specifications for Device Sensitivity -- 3.2. ESD Specifications for Equipment Immunity -- 3.3. Antistatic Control Procedures -- References. -- 4. ESD Diagnostics and Testing. -- 4.1. ESD Simulators: How They Work -- 4.2. Furniture Versus Personnel ESD Simulation -- 4.3. Other Types of ESD Simulators for Component Testing -- 4.4. ESD Test Setup--Direct and Indirect ESD -- 4.5. ESD Test Routine and Discharge Procedures -- 4.6. No Error/No Damage Concept: The Several Layers of Severity -- 4.7. The Error per Discharge Concept or Multiple-Trials Approach -- 4.8. ESD Test During Design and Development -- 4.9. ESD For Field Diagnostics and Forced Crash Method -- 4.10. Home-Made Investigation Tools and Diagnostic Hints -- References -- 5. Design for ESD Immunity -- 5.1. ESD Protection at Component Level -- 5.2. ESD Protection at the PCB Level (Internal Circuitry) -- 5.3. ESD Protection by Internal Wiring and Mechanical Packaging -- 5.4. ESD Protection by Box Shielding and Envelope Design -- 5.5. ESD Protection of External Cables and I/O Ports -- 5.6. ESD Immunity by Software and Noise Inhibition Techniques. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Remark 2 | 5.7. ESD Immunity with Miniature, Portable Devices -- 5.8. System ESD Immunity -- 5.9. ESD Control at Installation Level -- References -- 6. ESD Cases Studies -- 6.1. Case 1: The Reradiating Ground Strap -- 6.2. Case 2: ESD Hardening of a Printer -- 6.3. Case 3: The Data Terminal with Floating Tray -- 6.4. Case 4: The Safety Wire "Antenna" -- 6.5. Case 5: The Touchy Watchdog -- 6.6. Case 6: The Trigger-Happy Air bag Initiator -- 6.7. Conclusion: Troubleshooting Hints -- Appendix A. ESD Protection by Design of Chips and Microcircuits -- Appendix B. Prediction of ESD Damage Level for a Semiconductor Junction -- Appendix C. Spark-Over Voltages -- Appendix D. Fatigue Phenomena During Repeated ESD Testing -- Appendix E. Prediction of ESD-Induced Noise by Fast Frequency- Domain Calculations -- Appendix F. More Experiments on ESD Coupling to Boxes -- Appendix G. Examples of Simple SPICE Modeling of ESD Coupling Effects -- Appendix H. Time-to-Frequency Conversion for a Single Transient -- Index. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| Subject | Electronic apparatus and appliances |
| General subdivision | Protection. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| Subject | Electric discharges. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| Subject | Electrostatics. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Piscataway, New Jersey : |
| -- | IEEE Press, |
| -- | 2009. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [2009] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 12/21/2015. |
| 695 ## - | |
| -- | Sensitivity |
| 695 ## - | |
| -- | Surface discharges |
| 695 ## - | |
| -- | Surges |
| 695 ## - | |
| -- | Switches |
| 695 ## - | |
| -- | System-on-a-chip |
| 695 ## - | |
| -- | Testing |
| 695 ## - | |
| -- | Time domain analysis |
| 695 ## - | |
| -- | Time frequency analysis |
| 695 ## - | |
| -- | Transient analysis |
| 695 ## - | |
| -- | Transistors |
| 695 ## - | |
| -- | Varistors |
| 695 ## - | |
| -- | Wire |
| 695 ## - | |
| -- | Acceleration |
| 695 ## - | |
| -- | Atmospheric modeling |
| 695 ## - | |
| -- | Biological system modeling |
| 695 ## - | |
| -- | Cable shielding |
| 695 ## - | |
| -- | Capacitance |
| 695 ## - | |
| -- | Capacitors |
| 695 ## - | |
| -- | Clamps |
| 695 ## - | |
| -- | Conductors |
| 695 ## - | |
| -- | Connectors |
| 695 ## - | |
| -- | Contacts |
| 695 ## - | |
| -- | Couplings |
| 695 ## - | |
| -- | Current density |
| 695 ## - | |
| -- | Current measurement |
| 695 ## - | |
| -- | Discharges |
| 695 ## - | |
| -- | Electrodes |
| 695 ## - | |
| -- | Electromagnetic interference |
| 695 ## - | |
| -- | Electronic components |
| 695 ## - | |
| -- | Electrostatic discharge |
| 695 ## - | |
| -- | Electrostatics |
| 695 ## - | |
| -- | Equations |
| 695 ## - | |
| -- | Fatigue |
| 695 ## - | |
| -- | Fourier series |
| 695 ## - | |
| -- | Grounding |
| 695 ## - | |
| -- | Heating |
| 695 ## - | |
| -- | IEC standards |
| 695 ## - | |
| -- | Immune system |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Integrated circuit modeling |
| 695 ## - | |
| -- | Integrated circuits |
| 695 ## - | |
| -- | Ions |
| 695 ## - | |
| -- | Junctions |
| 695 ## - | |
| -- | Lead |
| 695 ## - | |
| -- | Logic gates |
| 695 ## - | |
| -- | Manufacturing |
| 695 ## - | |
| -- | Materials |
| 695 ## - | |
| -- | Mathematical model |
| 695 ## - | |
| -- | Metals |
| 695 ## - | |
| -- | Needles |
| 695 ## - | |
| -- | Noise |
| 695 ## - | |
| -- | Paints |
| 695 ## - | |
| -- | Physics |
| 695 ## - | |
| -- | Probes |
| 695 ## - | |
| -- | Rails |
| 695 ## - | |
| -- | Resistance |
| 695 ## - | |
| -- | Resistors |
| 695 ## - | |
| -- | SPICE |
| 695 ## - | |
| -- | Schottky diodes |
No items available.