Design for Testability, Debug and Reliability (Record no. 78265)
[ view plain ]
000 -LEADER | |
---|---|
fixed length control field | 03947nam a22005415i 4500 |
001 - CONTROL NUMBER | |
control field | 978-3-030-69209-4 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20220801220145.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 210419s2021 sz | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9783030692094 |
-- | 978-3-030-69209-4 |
082 04 - CLASSIFICATION NUMBER | |
Call Number | 006.22 |
100 1# - AUTHOR NAME | |
Author | Huhn, Sebastian. |
245 10 - TITLE STATEMENT | |
Title | Design for Testability, Debug and Reliability |
Sub Title | Next Generation Measures Using Formal Techniques / |
250 ## - EDITION STATEMENT | |
Edition statement | 1st ed. 2021. |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | XXI, 164 p. 47 illus., 25 illus. in color. |
505 0# - FORMATTED CONTENTS NOTE | |
Remark 2 | Introduction -- Integrated Circuits -- Formal Techniques -- Embedded Compression Architecture for Test Access Ports -- Optimization SAT-based Retargeting for Embedded Compression -- Reconfigurable TAP Controllers with Embedded Compression -- Embedded Multichannel Test Compression for Low-Pin Count Test -- Enhanced Reliability using Formal Techniques -- Conclusion and Outlook. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications. |
700 1# - AUTHOR 2 | |
Author 2 | Drechsler, Rolf. |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | https://doi.org/10.1007/978-3-030-69209-4 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
264 #1 - | |
-- | Cham : |
-- | Springer International Publishing : |
-- | Imprint: Springer, |
-- | 2021. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
337 ## - | |
-- | computer |
-- | c |
-- | rdamedia |
338 ## - | |
-- | online resource |
-- | cr |
-- | rdacarrier |
347 ## - | |
-- | text file |
-- | |
-- | rda |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Embedded computer systems. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronic circuit design. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Microprocessors. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Computer architecture. |
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Embedded Systems. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronics Design and Verification. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Processor Architectures. |
912 ## - | |
-- | ZDB-2-ENG |
912 ## - | |
-- | ZDB-2-SXE |
No items available.