The Boundary-Scan Handbook (Record no. 80286)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 03492nam a22005295i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-3-319-01174-5 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220801222009.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 151111s2016 sz | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783319011745 |
| -- | 978-3-319-01174-5 |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.3815 |
| 100 1# - AUTHOR NAME | |
| Author | Parker, Kenneth P. |
| 245 14 - TITLE STATEMENT | |
| Title | The Boundary-Scan Handbook |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 4th ed. 2016. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | XXXIV, 552 p. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Boundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 Digital Boundary-Scan IEEE Std 1149.4 Analog Boundary-Scan IEEE Std 1149.6 Advanced I/O Testing IEEE Std 1149.8.1 Passive Component Testing IEEE Std 1149.1-2013 The 2013 Revision of 1149.1 IEEE Std 1532 In-System Configuration IEEE Std 1149.6-2015 The 2015 Revision of 1149.6. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://doi.org/10.1007/978-3-319-01174-5 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Cham : |
| -- | Springer International Publishing : |
| -- | Imprint: Springer, |
| -- | 2016. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic circuits. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Microprocessors. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Computer architecture. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors. |
| 650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic Circuits and Systems. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Processor Architectures. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors. |
| 912 ## - | |
| -- | ZDB-2-ENG |
| 912 ## - | |
| -- | ZDB-2-SXE |
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