Outlook and Challenges of Nano Devices, Sensors, and MEMS (Record no. 80594)

000 -LEADER
fixed length control field 03294nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-3-319-50824-5
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220801222259.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 170222s2017 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783319508245
-- 978-3-319-50824-5
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
245 10 - TITLE STATEMENT
Title Outlook and Challenges of Nano Devices, Sensors, and MEMS
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2017.
300 ## - PHYSICAL DESCRIPTION
Number of Pages XVI, 521 p. 367 illus., 272 illus. in color.
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- High-k dielectric for nanoscale MOS devices -- Performance, optimization, and reliability of FinFET devices -- Performance, optimization, and challenges of emerging nanowire field-effect transistors -- Graphene technology for future MEMS and sensor applications -- Nanoscale sensors for next-generation optical transceiver applications -- Nanoscale MEMS for future optical communication applications -- Nanoscale devices for biomedical applications -- Effect of nanoscale structure on reliability of nano devices and sensors -- Compact modeling of nano devices and sensors -- Three-dimensional TCAD simulation of nano semiconductor devices -- Fabrication of nano devices based on novel material -- Novel processing technology for fabricating nano devices and sensors -- Conclusions.
520 ## - SUMMARY, ETC.
Summary, etc This book provides readers with an overview of the design, fabrication, simulation, and reliability of nanoscale semiconductor devices, MEMS, and sensors, as they serve for realizing the next-generation internet of things. The authors focus on how the nanoscale structures interact with the electrical and/or optical performance, how to find optimal solutions to achieve the best outcome, how these apparatus can be designed via models and simulations, how to improve reliability, and what are the possible challenges and roadblocks moving forward.
700 1# - AUTHOR 2
Author 2 Li, Ting.
700 1# - AUTHOR 2
Author 2 Liu, Ziv.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://doi.org/10.1007/978-3-319-50824-5
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2017.
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-- text
-- txt
-- rdacontent
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-- computer
-- c
-- rdamedia
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-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microtechnology.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microelectromechanical systems.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microsystems and MEMS.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology.
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-- ZDB-2-ENG
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-- ZDB-2-SXE

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