Theory of CMOS digital circuits and circuit failures / (Record no. 81265)

000 -LEADER
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001 - CONTROL NUMBER
control field ocn889252808
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220908100033.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
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007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
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008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 920312t19921992njua ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency E7B
Language of cataloging eng
Description conventions rda
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Transcribing agency E7B
Modifying agency OCLCO
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020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781400862849
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1400862841
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780691087634
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0691087636
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0691603014
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780691603018
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1515/9781400862849
Source of number or code doi
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier AU@
System control number 000056929753
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier CHBIS
System control number 011057809
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier CHVBK
System control number 498856453
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBBG
System control number BV042523994
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier DEBSZ
System control number 446794007
029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC)
OCLC library identifier GBVCP
System control number 100378416X
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)889252808
Canceled/invalid control number (OCoLC)956738559
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-- (OCoLC)1047005755
-- (OCoLC)1079012813
-- (OCoLC)1086506215
-- (OCoLC)1175625423
037 ## - SOURCE OF ACQUISITION
Stock number 22573/ctt738995
Source of stock number/acquisition JSTOR
037 ## - SOURCE OF ACQUISITION
Stock number 9453259
Source of stock number/acquisition IEEE
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871.99.M44
Item number S525 1992eb
072 #7 - SUBJECT CATEGORY CODE
Subject category code MAT040000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 009070
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39/5
Edition number 20
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Shoji, Masakazu,
Dates associated with a name 1936-
Relator term author.
9 (RLIN) 64206
245 10 - TITLE STATEMENT
Title Theory of CMOS digital circuits and circuit failures /
Statement of responsibility, etc. Masakazu Shoji.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Princeton, New Jersey :
Name of producer, publisher, distributor, manufacturer Princeton University Press,
Date of production, publication, distribution, manufacture, or copyright notice [1992]
264 #4 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice �1992
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (589 pages) :
Other physical details illustrations
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
347 ## - DIGITAL FILE CHARACTERISTICS
File type data file
Source rda
490 0# - SERIES STATEMENT
Series statement Princeton legacy library
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
588 0# - SOURCE OF DESCRIPTION NOTE
Source of description note Print version record.
505 00 - FORMATTED CONTENTS NOTE
Title Frontmatter --
-- Contents --
-- Preface and Acknowledgments --
-- List of Mathematical Symbols --
-- Chapter 1. Physics of CMOS Integrated Circuits --
-- Chapter 2. Method of Analysis of CMOS Circuit Failures --
-- Chapter 3. Circuit Failures Due to Anomalous Signal Flow --
-- Chapter 4. Noise Phenomena in Digital Circuits --
-- Chapter 5. Circuit Failures Due to Timing Problems --
-- Chapter 6. Essential Uncertainty in CMOS Circuits --
-- Chapter 7. Design Failures of CMOS Systems --
-- Index.
520 ## - SUMMARY, ETC.
Summary, etc. CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
546 ## - LANGUAGE NOTE
Language note In English.
590 ## - LOCAL NOTE (RLIN)
Local note IEEE
Provenance (VM) [OBSOLETE] IEEE Xplore Princeton University Press eBooks Library
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal oxide semiconductors, Complementary.
9 (RLIN) 3260
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Failures.
9 (RLIN) 64207
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Digital integrated circuits
General subdivision Design and construction
-- Data processing.
9 (RLIN) 64208
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element MOS compl�ementaires.
9 (RLIN) 64209
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semi-conducteurs
General subdivision D�efaillances.
9 (RLIN) 64210
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Circuits int�egr�es num�eriques
General subdivision Conception et construction
-- Informatique.
9 (RLIN) 64211
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element MATHEMATICS
General subdivision Complex Analysis.
Source of heading or term bisacsh
9 (RLIN) 63863
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element TECHNOLOGY & ENGINEERING
General subdivision Mechanical.
Source of heading or term bisacsh
9 (RLIN) 64212
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Digital integrated circuits
General subdivision Design and construction
-- Data processing.
Source of heading or term fast
Authority record control number or standard number (OCoLC)fst00893697
9 (RLIN) 64208
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metal oxide semiconductors, Complementary.
Source of heading or term fast
Authority record control number or standard number (OCoLC)fst01017635
9 (RLIN) 3260
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Failures.
Source of heading or term fast
Authority record control number or standard number (OCoLC)fst01112222
9 (RLIN) 64207
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
9 (RLIN) 3294
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Shoji, Masakazu.
Title Theory of CMOS digital circuits and circuit failures.
Place, publisher, and date of publication Princeton, New Jersey : Princeton University Press, [1992]
Physical description xviii, 570 pages ; 27 cm
Series data for related item Princeton legacy library
International Standard Book Number 9780691603018
Record control number (DLC) 10899030
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://ieeexplore.ieee.org/servlet/opac?bknumber=9453259">https://ieeexplore.ieee.org/servlet/opac?bknumber=9453259</a>
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Koha item type eBooks
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