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Reflection high-energy electron diffraction / (Record no. 82187)

000 -LEADER
fixed length control field 02896nam a22003738i 4500
001 - CONTROL NUMBER
control field CR9780511735097
003 - CONTROL NUMBER IDENTIFIER
control field UkCbUP
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230516164906.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m|||||o||d||||||||
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr||||||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100325s2004||||enk o ||1 0|eng|d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780511735097 (ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780521453738 (hardback)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780521184021 (paperback)
040 ## - CATALOGING SOURCE
Original cataloging agency UkCbUP
Language of cataloging eng
Description conventions rda
Transcribing agency UkCbUP
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC176.84.S93
Item number I24 2004
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 530.4/275
Edition number 22
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Ichimiya, Ayahiko,
Dates associated with a name 1940-
Relator term author.
9 (RLIN) 67949
245 10 - TITLE STATEMENT
Title Reflection high-energy electron diffraction /
Statement of responsibility, etc. Ayahiko Ichimiya and Philip I. Cohen.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cambridge :
Name of producer, publisher, distributor, manufacturer Cambridge University Press,
Date of production, publication, distribution, manufacture, or copyright notice 2004.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xi, 353 pages) :
Other physical details digital, PDF file(s).
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
500 ## - GENERAL NOTE
General note Title from publisher's bibliographic system (viewed on 05 Oct 2015).
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Historical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations.
520 ## - SUMMARY, ETC.
Summary, etc. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Reflection high energy electron diffraction.
9 (RLIN) 67950
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thin films
General subdivision Surfaces
-- Analysis.
9 (RLIN) 67951
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Cohen, Philip I.,
Relator term author.
9 (RLIN) 67952
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 9780521453738
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1017/CBO9780511735097">https://doi.org/10.1017/CBO9780511735097</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks

No items available.