Central Library

Electromigration in metals : (Record no. 82197)

000 -LEADER
fixed length control field 02981nam a2200397 i 4500
001 - CONTROL NUMBER
control field CR9781139505819
003 - CONTROL NUMBER IDENTIFIER
control field UkCbUP
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230516164908.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m|||||o||d||||||||
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr||||||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120509s2022||||enk o ||1 0|eng|d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781139505819 (ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781107032385 (hardback)
040 ## - CATALOGING SOURCE
Original cataloging agency UkCbUP
Language of cataloging eng
Description conventions rda
Transcribing agency UkCbUP
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7874.53
Item number .H62 2022
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23/eng/20220110
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Ho, P. S.,
Relator term author.
9 (RLIN) 67974
245 10 - TITLE STATEMENT
Title Electromigration in metals :
Remainder of title fundamentals to nano-interconnects /
Statement of responsibility, etc. Paul S. Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cambridge ; New York, NY :
Name of producer, publisher, distributor, manufacturer Cambridge University Pres,
Date of production, publication, distribution, manufacture, or copyright notice 2022.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xiii, 417 pages) :
Other physical details digital, PDF file(s).
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
500 ## - GENERAL NOTE
General note Title from publisher's bibliographic system (viewed on 07 Apr 2022).
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction to electromigration -- Fundamentals of electromigration -- Thermal stress characteristics and stress induced void formation in aluminium and copper interconnects -- Stress evolution and damage formation in confined metal lines under electric stressing -- Electromigration in Cu interconnect structures -- Scaling effects on microstructure and resistivity of Cu and Co nanointerconnects analysis of electromigration induced stress evolution and voiding in Cu damascene lines with microstructure -- Massive scale statistical studies for electromigration -- Assessment of electromigration damage in large on-chip power grids.
520 ## - SUMMARY, ETC.
Summary, etc. Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Interconnects (Integrated circuit technology)
General subdivision Materials.
9 (RLIN) 67975
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metals
General subdivision Electric properties.
9 (RLIN) 67976
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electrodiffusion.
9 (RLIN) 67977
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Hu, Chao-Kun,
Dates associated with a name 1946-
Relator term author.
9 (RLIN) 67978
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Gall, Martin,
Relator term author.
9 (RLIN) 67979
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sukharev, Valeriy,
Dates associated with a name 1952-
Relator term author.
9 (RLIN) 67980
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 9781107032385
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1017/9781139505819">https://doi.org/10.1017/9781139505819</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks

No items available.