Resilient Architecture Design for Voltage Variation (Record no. 85440)

000 -LEADER
fixed length control field 03668nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-3-031-01739-1
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240730164220.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220601s2013 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783031017391
-- 978-3-031-01739-1
082 04 - CLASSIFICATION NUMBER
Call Number 621.3815
100 1# - AUTHOR NAME
Author Reddi, Vijay Janapa.
245 10 - TITLE STATEMENT
Title Resilient Architecture Design for Voltage Variation
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2013.
300 ## - PHYSICAL DESCRIPTION
Number of Pages XVI, 124 p.
490 1# - SERIES STATEMENT
Series statement Synthesis Lectures on Computer Architecture,
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Modeling Voltage Variation -- Understanding the Characteristics of Voltage Variation -- Traditional Solutions and Emerging Solution Forecast -- Allowing and Tolerating Voltage Emergencies -- Predicting and Avoiding Voltage Emergencies -- Eliminiating Recurring Voltage Emergencies -- Future Directions on Resiliency.
520 ## - SUMMARY, ETC.
Summary, etc Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructsthat can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency.
700 1# - AUTHOR 2
Author 2 Gupta, Meeta Sharma.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://doi.org/10.1007/978-3-031-01739-1
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2013.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microprocessors.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer architecture.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Processor Architectures.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
-- 1935-3243
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-- ZDB-2-SXSC

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