X-RAY OPTICS AND MICROANALYSIS
By: BOROVSKII,I.B.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Call number | Status | Date due | Barcode |
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CENTRAL LIBRARY | 669.950282 B726 (Browse shelf) | Available | 050617 |
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669.95028 B612 TRANSDUCERS FOR ULTRASONIC FLAW DETECTION | 669.950282 B154 ROLE MICROSTRUCTURES IN METALS | 669.950282 B212 IN SITY ELECTRON MICROSCOPY AT HIGH RESOLUTION | 669.950282 B726 X-RAY OPTICS AND MICROANALYSIS | 669.950282 C7523 POLARIZED LIGHT IN METALLOGRAPHY | 669.950282 D323 IN-SITU ELECTRON MICROSCOPY | 669.950282 D612 TRANSMISSION ELECTRON ENERGY LOSS SPECTROMETRY IN MATERIALS SCIENCE |
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