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MEASUREMENT AND MODELING OF SILICON HETEROSTRUCTURE DEVICES

By: CRESSLER,J.D.
Material type: materialTypeLabelBookPublisher: Boca Raton CRC 2008Description: xii+150p.,22x16Cms.ISBN: 1420066927.DDC classification: 621.38152 C912
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621.38152 C912 (Browse shelf) Available 080609

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