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CMOS SRAM CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES

By: PAVLOV, A.
Material type: materialTypeLabelBookPublisher: CANADA Springer 2008Description: xvi+193p.,22x18Cms.ISBN: 1402083624.DDC classification: 621.38175 P338
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621.38175 P338 (Browse shelf) Available 083830

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