DIGITAL INTEGRATED CIRCUITS: DESIGN-FOR-TEST USING SIMULINK AND STATEFLOW
By: PERELROYZEN, E.
Material type:
BookPublisher: Boca Raton CRC 2013Description: 320p.,22x14Cms.ISBN: 0849330572.DDC classification: 621.38173 P435
| Item type | Current location | Call number | Status | Date due | Barcode |
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CENTRAL LIBRARY | 621.38173 P435 (Browse shelf) | Available | 099370 |
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| 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 N225 LEAKAGE IN NANOMETER CMOS TECHNOLOGIES | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS:DESIGN-FOR-TEST-USING SIMULINK AND STSTEFLOW | 621.38173 P435 DIGITAL INTEGRATED CIRCUITS: DESIGN-FOR-TEST USING SIMULINK AND STATEFLOW | 621.38173 P435;3 DIGITAL INTEGRATED CIRCUITS. | 621.38173 P977 BASIC VLSI DESIGN | 621.38173 P977 BASIC VLSI DESIGN |
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