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Silicon Analog Components [electronic resource] : Device Design, Process Integration, Characterization, and Reliability / by Badih El-Kareh, Lou N. Hutter.

By: El-Kareh, Badih [author.].
Contributor(s): Hutter, Lou N [author.] | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: New York, NY : Springer New York : Imprint: Springer, 2015Description: XLI, 607 p. 454 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781493927517.Subject(s): Engineering | Electronic circuits | Optical materials | Electronic materials | Engineering | Circuits and Systems | Electronic Circuits and Devices | Optical and Electronic MaterialsAdditional physical formats: Printed edition:: No titleDDC classification: 621.3815 Online resources: Click here to access online
Contents:
The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
In: Springer eBooksSummary: This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
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The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.

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