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Nonvolatile semiconductor memory technology : a comprehensive guide to understanding and to using NVSM devices / edited by William D. Brown, Joe E. Brewer.

Contributor(s): Brewer, Joe (Joe E.) | Brown, William D, 1943- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].
Material type: materialTypeLabelBookSeries: IEEE Press series on microelectronic systems: 6Publisher: New York : IEEE Press, c1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1997]Description: 1 PDF (xxiii, 589 pages) : illustrations.Content type: text Media type: electronic Carrier type: online resourceISBN: 9780470545409.Subject(s): Semiconductor storage devices | Aerospace electronics | Arrays | Belts | Bibliographies | Biographies | Capacitors | Cosmic rays | Dielectrics | EPROM | Electric potential | Electrodes | Failure analysis | Flash memory | History | Indexes | Insulators | Integrated circuit reliability | Integrated circuits | Logic gates | Neutrons | Nonvolatile memory | Orbits | Performance evaluation | Power supplies | Procurement | Programming | Protons | Random access memory | Reliability | Reliability engineering | SONOS devices | Satellites | Semiconductor memory | Silicon | Testing | Timing | Transistors | TunnelingGenre/Form: Electronic books.Additional physical formats: Print version:: No titleDDC classification: 621.39/732 Online resources: Abstract with links to resource Also available in print.
Contents:
Basics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman.
Summary: "Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.
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Includes bibliographical references (p. 483-553) and index.

Basics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman.

Restricted to subscribers or individual electronic text purchasers.

"Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.

Also available in print.

Mode of access: World Wide Web

Description based on PDF viewed 12/21/2015.

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