VLSI Design and Test for Systems Dependability
By: Asai, Shojiro.
Publisher: Japan Springer 2019Description: p.800.ISBN: 9784431565925.Subject(s): Electromagnetic Noises | Variations in Device Characteristics | Design and Development of Electronic Systems for Quality and DependabilityDDC classification: 621.395 A80V| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
|
CENTRAL LIBRARY | 621.395 A80V (Browse shelf) | Available | 105258 |
There are no comments for this item.