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Microwave dielectric materials and applications / edited by Dr. Mailadil T. Sebastian, Dr. Heli Jantunen, Dr. Rick Ubic.

Contributor(s): Sebastian, M. T, 1952- [editor.] | Jantunen, Heli [editor.] | Ubic, Rick [editor.].
Material type: materialTypeLabelBookPublisher: Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2017Description: 1 online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781119208549; 1119208548.Subject(s): Microwave devices -- Materials | Dielectrics | Dielectrics | Microwave devices -- Materials | TECHNOLOGY & ENGINEERING / MechanicalGenre/Form: Electronic books.Additional physical formats: Print version:: Microwave dielectric materials and applications.DDC classification: 621.381/30284 Online resources: Wiley Online Library
Contents:
Microwave Materials and Applications; Contents; List of Contributors; Series Preface; Wiley Series in Materials for Electronic and Optoelectronic Applications; Preface; 1 Measurement of Microwave Dielectric Properties and Factors Affecting Them; 1.1 Introduction; 1.2 Permittivity ( r) and quality factor (Q); 1.3 Measurement of Microwave Dielectric Properties; 1.4 Methods of Measurement; 1.4.1 Hakki and Coleman (Courtney) Method; 1.4.2 TE01d Mode Dielectric Resonator Method; 1.4.3 Measurement of the Quality Factor by a Strip Line Excited Using the Cavity Method
1.4.4 Whispering Gallery Mode (WGM) Resonators1.4.5 Split Post Dielectric Resonator (SPDR); 1.4.6 Cavity Perturbation Method; 1.4.7 TM0n0 Mode and Re-entrant Cavity Methods; 1.4.8 TE01n Mode Cavities; 1.4.9 Thin Samples and Free-Space Methods; 1.5 Measurement of EMI Shielding Effectiveness; 1.5.1 Waveguide Method; 1.6 Terahertz and Millimeter Wave Measurements; 1.6.1 Backward Wave Oscillator (BWO); 1.6.2 Terahertz Time-Domain Spectroscopy (THz-TDS); 1.7 Measurement of Dielectric Properties of Powder Samples; 1.8 Estimation of Dielectric Loss by Spectroscopic Methods
1.9 Factors Affecting Dielectric Loss1.10 Measurement of Temperature Coefficient of Resonant Frequency; 1.11 Tuning of the Resonant Frequency; References; 2 Modeling of Microwave Dielectric Properties of Composites; 2.1 Introduction; 2.2 Connectivity; 2.3 Electrostatic Theory; 2.3.1 Polarizability; 2.3.2 Scattering; 2.3.3 Orientation; 2.4 Mixing Equations; 2.4.1 Clausius-Mossotti; 2.4.2 Maxwell-Garnett; 2.4.3 Bruggeman Symmetric; 2.4.4 Bruggeman Non-symmetric; 2.4.5 Sen Scala-Cohen; 2.4.6 Coherent Potential; 2.4.7 Looyenga; 2.4.8 Lichtenecker; 2.4.9 Modified Lichtenecker; 2.4.10 Differential
2.4.11 General Mixing Model2.4.12 Effective Medium Theory (EMT); 2.4.13 Jayasundere-Smith; 2.4.14 Vo-Shi; 2.4.15 Interphase Power Law (IPL); 2.5 Effect of Porosity; 2.5.1 Permittivity; 2.5.2 Dielectric Losses; 2.5.3 Dielectric Properties of Powders; 2.6 Conclusion; References; 3 Perovskites; 3.1 Introduction; 3.2 Lattice Constant Prediction; 3.3 Tolerance Factor; 3.4 Octahedral Tilting; 3.5 Simple Perovskites; 3.5.1 LnAlO3 Type Materials; 3.5.2 Ag(Nb1-xTax)O3 Type Materials; 3.5.3 Ca-Based Perovskites; 3.6 Cation Ordering; 3.6.1 1:1 Ordered Perovskites; 3.6.2 1:2 Ordering; 3.6.3 1:3 Ordering
3.6.4 1:2:1 Ordering3.7 Cation Deficient Perovskites; 3.8 Summary; References; 4 High Permittivity Materials; 4.1 Introduction; 4.2 The BaO-Ln2O3-TiO2 System; 4.2.1 Crystal Structure of Ba6-3xLn8+2xTi18O54; 4.2.2 Tolerance Factor and Its Effect on the Temperature Coefficient; 4.2.3 Microwave Dielectric Properties of BaO-Ln2O3-TiO2 System; 4.3 The Effect of Processing Parameters on Electrical Properties; 4.4 Titania; 4.5 Sr1-3x/2CexTiO3 Ceramics; 4.5.1 Crystal Structure of Sr1-3x/2CexTiO3 System; 4.5.2 Microstructure and Dielectric Properties of SCT ceramics; 4.5.3 (Sr0.75-xPbxCe0.167)TiO3
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Microwave Materials and Applications; Contents; List of Contributors; Series Preface; Wiley Series in Materials for Electronic and Optoelectronic Applications; Preface; 1 Measurement of Microwave Dielectric Properties and Factors Affecting Them; 1.1 Introduction; 1.2 Permittivity ( r) and quality factor (Q); 1.3 Measurement of Microwave Dielectric Properties; 1.4 Methods of Measurement; 1.4.1 Hakki and Coleman (Courtney) Method; 1.4.2 TE01d Mode Dielectric Resonator Method; 1.4.3 Measurement of the Quality Factor by a Strip Line Excited Using the Cavity Method

1.4.4 Whispering Gallery Mode (WGM) Resonators1.4.5 Split Post Dielectric Resonator (SPDR); 1.4.6 Cavity Perturbation Method; 1.4.7 TM0n0 Mode and Re-entrant Cavity Methods; 1.4.8 TE01n Mode Cavities; 1.4.9 Thin Samples and Free-Space Methods; 1.5 Measurement of EMI Shielding Effectiveness; 1.5.1 Waveguide Method; 1.6 Terahertz and Millimeter Wave Measurements; 1.6.1 Backward Wave Oscillator (BWO); 1.6.2 Terahertz Time-Domain Spectroscopy (THz-TDS); 1.7 Measurement of Dielectric Properties of Powder Samples; 1.8 Estimation of Dielectric Loss by Spectroscopic Methods

1.9 Factors Affecting Dielectric Loss1.10 Measurement of Temperature Coefficient of Resonant Frequency; 1.11 Tuning of the Resonant Frequency; References; 2 Modeling of Microwave Dielectric Properties of Composites; 2.1 Introduction; 2.2 Connectivity; 2.3 Electrostatic Theory; 2.3.1 Polarizability; 2.3.2 Scattering; 2.3.3 Orientation; 2.4 Mixing Equations; 2.4.1 Clausius-Mossotti; 2.4.2 Maxwell-Garnett; 2.4.3 Bruggeman Symmetric; 2.4.4 Bruggeman Non-symmetric; 2.4.5 Sen Scala-Cohen; 2.4.6 Coherent Potential; 2.4.7 Looyenga; 2.4.8 Lichtenecker; 2.4.9 Modified Lichtenecker; 2.4.10 Differential

2.4.11 General Mixing Model2.4.12 Effective Medium Theory (EMT); 2.4.13 Jayasundere-Smith; 2.4.14 Vo-Shi; 2.4.15 Interphase Power Law (IPL); 2.5 Effect of Porosity; 2.5.1 Permittivity; 2.5.2 Dielectric Losses; 2.5.3 Dielectric Properties of Powders; 2.6 Conclusion; References; 3 Perovskites; 3.1 Introduction; 3.2 Lattice Constant Prediction; 3.3 Tolerance Factor; 3.4 Octahedral Tilting; 3.5 Simple Perovskites; 3.5.1 LnAlO3 Type Materials; 3.5.2 Ag(Nb1-xTax)O3 Type Materials; 3.5.3 Ca-Based Perovskites; 3.6 Cation Ordering; 3.6.1 1:1 Ordered Perovskites; 3.6.2 1:2 Ordering; 3.6.3 1:3 Ordering

3.6.4 1:2:1 Ordering3.7 Cation Deficient Perovskites; 3.8 Summary; References; 4 High Permittivity Materials; 4.1 Introduction; 4.2 The BaO-Ln2O3-TiO2 System; 4.2.1 Crystal Structure of Ba6-3xLn8+2xTi18O54; 4.2.2 Tolerance Factor and Its Effect on the Temperature Coefficient; 4.2.3 Microwave Dielectric Properties of BaO-Ln2O3-TiO2 System; 4.3 The Effect of Processing Parameters on Electrical Properties; 4.4 Titania; 4.5 Sr1-3x/2CexTiO3 Ceramics; 4.5.1 Crystal Structure of Sr1-3x/2CexTiO3 System; 4.5.2 Microstructure and Dielectric Properties of SCT ceramics; 4.5.3 (Sr0.75-xPbxCe0.167)TiO3

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