EM Material Characterization Techniques for Metamaterials [electronic resource] / by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu.
By: Nair, Raveendranath U [author.]
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Contributor(s): Dutta, Maumita [author.] | P.S., Mohammed Yazeen [author.] | Venu, K. S [author.] | SpringerLink (Online service).
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BookSeries: SpringerBriefs in Computational Electromagnetics: Publisher: Singapore : Springer Nature Singapore : Imprint: Springer, 2018Edition: 1st ed. 2018.Description: XXIII, 50 p. 18 illus., 12 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9789811065170.Subject(s): Telecommunication | Optical materials | Microwaves, RF Engineering and Optical Communications | Optical Materials | Communications Engineering, NetworksAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 621.3 Online resources: Click here to access online
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Springer Nature eBookSummary: This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
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