ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCU
By: BUSHNELL,M.L.
Material type:
BookPublisher: Boston Kluwer Academic 2000Description: xxviii+690p.,26x18Cm.ISBN: 0-7923-7991-8.DDC classification: 621.395 B978
| Item type | Current location | Call number | Status | Date due | Barcode |
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Reference Books
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CENTRAL LIBRARY | 621.395 B978 (Browse shelf) | Not for loan | 071741 |
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