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Laser beam profiling : cost-effective solutions / Akhil Kallepalli, David B. James.

By: Kallepalli, Akhil [author.].
Contributor(s): James, David B. (Ph. D.) [author.] | Institute of Physics (Great Britain) [publisher.].
Material type: materialTypeLabelBookSeries: IOP (Series)Release 22: ; IOP ebooks2022 collection: Publisher: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]Description: 1 online resource (various pagings) : illustrations (some color).Content type: text Media type: electronic Carrier type: online resourceISBN: 9780750338356; 9780750338349.Subject(s): Semiconductor lasers | Optical detectors | Optical physics | Optics and photonicsAdditional physical formats: Print version:: No titleDDC classification: 535.15 Online resources: Click here to access online Also available in print.
Contents:
1. Introduction -- 1.1. Light -- 1.2. Detectors -- 1.3. Benefits of using an imaging system
2. Lasers -- 2.1. Light emission, absorption and matter interactions -- 2.2. Properties of lasers and laser light -- 2.3. Laser safety -- 2.4. Additional resources
3. Silicon-based imaging systems -- 3.1. Vision -- 3.2. Detectors -- 3.3. Charge-coupled devices (CCD) detectors -- 3.4. Complementary metal-oxide-semiconductor (CMOS) detectors -- 3.5. Detector characteristics -- 3.6. Additional resources
4. Experimental techniques -- 4.1. Experimental workflow
5. Potential sources of error -- 5.1. Equipment alignment -- 5.2. Sensor saturation -- 5.3. Neutral density filters -- 5.4. Dead pixels -- 5.5. Laser stability -- 5.6. Stray light and background correction -- 6. Conclusions and final remarks.
Abstract: This book provides an overview of lasers, silicon sensors, and practical solutions to beam profiling which has never been presented in a single text. Understanding laser beam characteristics before and after interaction with an object provides intrinsic insights into the nature of the object.
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"Version: 20220401"--Title page verso.

Includes bibliographical references.

1. Introduction -- 1.1. Light -- 1.2. Detectors -- 1.3. Benefits of using an imaging system

2. Lasers -- 2.1. Light emission, absorption and matter interactions -- 2.2. Properties of lasers and laser light -- 2.3. Laser safety -- 2.4. Additional resources

3. Silicon-based imaging systems -- 3.1. Vision -- 3.2. Detectors -- 3.3. Charge-coupled devices (CCD) detectors -- 3.4. Complementary metal-oxide-semiconductor (CMOS) detectors -- 3.5. Detector characteristics -- 3.6. Additional resources

4. Experimental techniques -- 4.1. Experimental workflow

5. Potential sources of error -- 5.1. Equipment alignment -- 5.2. Sensor saturation -- 5.3. Neutral density filters -- 5.4. Dead pixels -- 5.5. Laser stability -- 5.6. Stray light and background correction -- 6. Conclusions and final remarks.

This book provides an overview of lasers, silicon sensors, and practical solutions to beam profiling which has never been presented in a single text. Understanding laser beam characteristics before and after interaction with an object provides intrinsic insights into the nature of the object.

Interdisciplinary students, researchers, and scientists experimenting using laser systems. Optics students with a need visualise the translation of lasers and sensors from a theoretical to a practical perspective.

Also available in print.

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Dr. Akhil Kallepalli is a Research Associate in the Optics Group, School of Physics and Astronomy at the University of Glasgow. Dr. David B. James is a Senior Lecturer and Head of the Centre for Electronic Warfare, Information and Cyber.

Title from PDF title page (viewed on May 8, 2022).

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