Wang, Laung, Terng. Stroud, Charles, E. Touba, Nur, A. <br/><br/>
System-on-Chip Test Architectures  Nanometer Design for Testability 

 - Amsterdam  Elsevier  2008 
 - xxxvi+856p.,24X19Cms 
<br/><br/><label>ISBN: </label>9780123739735 
<br/><br/><label>Dewey Class. No.: </label>621.395 W246