EGERTON,R.F. <br/><br/>
PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY:INTRODUCTION TO TEM,SEM AND AEM 

 - NEW YORK  Springer  2007 
 - xii+202p.,22x18Cms 
<br/><br/><label>ISBN: </label>0387258003 
<br/><br/><label>Dewey Class. No.: </label>669.950282 E29