Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] /
Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
- London : Hoboken : ISTE Ltd. ; Wiley 2021.
- 1 online resource
- Mechanical engineering and solid mechanics series Reliability of multiphysical systems set ; v. 9 .
- Mechanical engineering and solid mechanics series. Reliability of multiphysical systems set ; v. 9. .
Includes bibliographical references and index.
Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.