Dahoo, Pierre Richard,

Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Measurement systems, quantum engineering and RBDO method Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami - 1 online resource. - Reliability of Multiphysical Systems Set ; Volume 10 . - Reliability of multiphysical systems set ; v. 10. .

Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics

9781119818984 1119818982

10.1002/9781119818984 doi


Metrology.


Electronic books.

QC88

389/.1