Sun, Yabin.

Research on the Radiation Effects and Compact Model of SiGe HBT [electronic resource] / by Yabin Sun. - 1st ed. 2018. - XXIV, 168 p. 171 illus. online resource. - Springer Theses, Recognizing Outstanding Ph.D. Research, 2190-5061 . - Springer Theses, Recognizing Outstanding Ph.D. Research, .

Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion.

This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.

9789811046124

10.1007/978-981-10-4612-4 doi


Electronics.
Semiconductors.
Optical materials.
Electronic circuits.
Condensed matter.
Electronics and Microelectronics, Instrumentation.
Semiconductors.
Optical Materials.
Electronic Circuits and Systems.
Condensed Matter Physics.

TK7800-8360

621.381