Characterization of high Tc materials and devices by electron microscopy / 
 Characterization of High Tc Materials & Devices by Electron Microscopy 
edited by Nigel D. Browning, Stephen J. Pennycook. 
 - 1 online resource (xii, 391 pages) :  digital, PDF file(s). 
<br/><br/> Title from publisher's bibliographic system (viewed on 05 Oct 2015). 
<br/><br/> High-resolution transmission electron microscopy /  Holography in the transmission electron microscope /  Microanalysis by scanning transmission electron microscopy /  Specimen preparation for transmission electron microscopy /  Low-temperature scanning electron microscopy /  Scanning tunneling microscopy /  Identification of new superconducting compounds by electron microscopy /  Valence band electron energy loss spectroscopy (EELS) of oxide superconductors /  S. Horiuchi and L. He --  A. Tonomura --  L.M. Brown and J. Yuan --  J.G. Wen --  R.P. Huebener --  M.E. Hawley --  G. Van Tendeloo and T. Krekels --  Y.Y. Wang and V.P. Dravid.  1.  2.  3.  4.  5.  6.  7.  8. 
<br/><br/> This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. 
<br/><br/><label>ISBN: </label>9780511534829 (ebook) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>High temperature superconductors.<br/>Electron microscopy--Technique.
<br/><br/><label>LC Class. No.: </label>QC611.98.H54  / C43 2000 
<br/><br/><label>Dewey Class. No.: </label>537.6/23/0284