<![CDATA[Central Library Search for 'au:"EGERTON, R.F."']]>

<![CDATA[Central Library Search for 'au:"EGERTON, R.F."']]> https://opac.nitk.ac.in/cgi-bin/koha/opac-search.pl?q=ccl=au%3A%22EGERTON%2C%20R.F.%22&format=rss2 2 0 50 PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY ISBN 9783319398761 https://opac.nitk.ac.in/cgi-bin/koha/opac-detail.pl?biblionumber=32712

By EGERTON, R.F.. SWITZERLAND Springer 2016 . xi+196p.,24X16Cms. 9783319398761

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]]> https://opac.nitk.ac.in/cgi-bin/koha/opac-detail.pl?biblionumber=32712 PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY:INTRODUCTION TO TEM,SEM AND AEM ISBN 0387258003 https://opac.nitk.ac.in/cgi-bin/koha/opac-detail.pl?biblionumber=33505 By EGERTON,R.F.. NEW YORK Springer 2007 . xii+202p.,22x18Cms 0387258003

Place Hold on PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY:INTRODUCTION TO TEM,SEM AND AEM

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