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Contamination and ESD control in high technology manufacturing / Roger W. Welker, R. Nagarajan, Carl E. Newberg.
by Welker, R. W [author.] | Nagarajan, R. (Ramamurthy) | Newberg, Carl E | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type:  Book; Format:
available online
 Publisher: Hoboken, New Jersey : John Wiley & Sons, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
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Insulators for icing and polluted environments / by Masoud Farzaneh, William A. Chisholm.
by Farzaneh, M., (Masoud) [author.] | Chisholm, William A | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Oxford : Wiley-Blackwell, 2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Analysis of nanoplastics and microplastics in food / edited by Leo M. L. Nollet, Khwaja Salahuddin Siddiqi.
by Nollet, Leo M. L, 1948- [editor.] | Siddiqi, K. S [editor.]. Edition: First edition.Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2021Copyright date: ©2021Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Surface contamination and cleaning. Volume 1 / edited by Kash L. Mittal.
by Mittal, Kash L, 1945- [editor.] | Taylor and Francis. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2003Online access: Click here to view. Availability: No items available
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Fingerprinting Techniques in Food Authentication and Traceability / edited by K. S. Siddiqi and Leo M.L. Nollet.
by Siddiqi, K. S [editor.] | Nollet, Leo M.L [editor.] | Taylor and Francis. Edition: First edition.Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available
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Contamination and ESD control in high technology manufacturing / Roger W. Welker, R. Nagarajan, Carl E. Newberg.
by Welker, R. W [author.] | Nagarajan, R. (Ramamurthy) | Newberg, Carl E | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : John Wiley & Sons, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
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Insulators for icing and polluted environments / by Masoud Farzaneh, William A. Chisholm.
by Farzaneh, M., (Masoud) [author.] | Chisholm, William A | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Oxford : Wiley-Blackwell, 2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Surfactants in precision cleaning : removal of contaminants at the micro and nanoscale / edited by Rajiv Kohli and K.L. Mittal. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Amsterdam, Netherlands : Elsevier, 2021Online access: ScienceDirect Availability: No items available
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