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Analysis of queues : methods and applications / by Natarajan Gautam.

by Gautam, Natarajan [author.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2012Online access: Click here to view. Availability: No items available

Principles of supply chain management / by Richard E. Crandall, William R. Crandall and Charlie C. Chen.

by Crandall, Richard E, 1930- [author.] | Chen, Charlie C [author.] | Crandall, Richard E, 1930- [author.] | Crandall, William R. (William Richard), 1956- [author.] | Taylor and Francis.

Edition: Second edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2014Online access: Click here to view. Availability: No items available

Optimization methods for manufacturing [electronic resource] / editor, Cornelius Leondes.

by Leondes, Cornelius T | CRC Press.

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2001Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Additive Manufacturing : Applications and Innovations / edited by Rupinder Singh and J. Paulo Davim.

by Singh, Rupinder [editor.] | Davim, J. Paulo [editor.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available

Optical inspection of microsystems / edited by Wolfgang Osten.

by Osten, Wolfgang [editor.].

Edition: Second edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press/Taylor & Francis Group, [2020]Copyright date: ©2020Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available