Metrology and standardization of nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
Contributor(s): Mansfield, Elisabeth [editor.]
| Kaiser, Debra L [editor.]
| Fujita, Daisuke [editor.]
| Voorde, M. H. van de (Marcel H.) [editor.]
.
Material type: ![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
No physical items for this record
Includes bibliographical references and index.
Online resource; title from PDF title page (John Wiley, viewed January 31, 2017).
There are no comments for this item.