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Power quality issues : current harmonics / Suresh Mikkili, Anup Kumar Panda.

by Mikkili, Suresh [author.] | Panda, Anup Kumar [author.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2016]Copyright date: ©2016Online access: Click here to view. Availability: No items available

Harmonic generation effects propagation and control / J.C. Das.

by Das, J. C, 1934- [author.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : Taylor & Francis, a CRC title, part of the Taylor & Francis imprint, a member of the Taylor & Francis Group, the academic division of T&F Informa, plc, 2018Online access: Click here to view. Availability: No items available

Modeling and simulation based analysis in reliability engineering / edited by Mangey Ram.

by Ram, Mangey [editor.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available

Statistical quality control / M. Jeya Chandra.

by Chandra, M. Jeya [author.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2001Online access: Click here to view. Availability: No items available

Six sigma for medical device design / Jose Justiniano, Venky Gopalaswamy.

by Justiniano, Jose M [author.] | Gopalaswamy, Venky.

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, Fla. : CRC Press, 2005Online access: Click here to view. Availability: No items available

Reliability management and engineering : challenges and future trends / edited by Harish Garg and Mangey Ram.

by Garg, Harish [editor.] | Ram, Mangey [editor.].

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2020Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Handbook of multivariate process capability indices / Ashis Kumar Chakraborty, Moutushi Chatterjee.

by Chakraborty, Ashis K [author.] | Chatterjee, Moutushi [author.].

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2021Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Fingerprinting Analysis and Quality Control Methods of Herbal Medicines / by Ravindra Kumar Pandey, Shiv Shankar Shukla, Amber Vyas, Vishal Jain, Parag Jain and Shailendra Saraf.

by Pandey, Ravindra Kumar [author.] | Shukla, Shiv Shankar [author.] | Vyas, Amber [author.] | Jain, Vishal [author.] | Jain, Parag [author.] | Saraf, Shailendra [author.] | Taylor and Francis.

Edition: 1st edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available

System Reliability Management : Solutions and Technologies / edited by Adarsh Anand and Mangey Ram.

by Anand, Adarsh [editor.] | Ram, Mangey [editor.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2018Online access: Click here to view. Availability: No items available

Food traceability and authenticity : analytical techniques / editors, Didier Montet, food safety team leader, UMR Qualisud, CIRAD, Montpellier, France, and Ramesh C. Ray, principal scientist (microbiology), ICAR - Central Tuber Crops Research

by Didier, Montet [editor.] | Ray, Ramesh C [editor.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, Fla. : CRC Press, [2018]Copyright date: ©2018Online access: Click here to view. Availability: No items available

Optical inspection of microsystems / edited by Wolfgang Osten.

by Osten, Wolfgang [editor.].

Edition: Second edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press/Taylor & Francis Group, [2020]Copyright date: ©2020Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Engineering economics of life cycle cost analysis / by John Vail Farr and Isaac Faber.

by Farr, John V [author.] | Faber, Isaac [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press/Taylor & Francis Group, 2018Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Computational paradigm techniques for enhancing electric power quality / L. Ashok Kumar and S Albert Alexander.

by Kumar, L. Ashok [author.] | Albert Alexander, S [author.].

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York, NY : CRC Press/Taylor & Francis Group, 2019Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Advanced mathematical techniques in engineering sciences / edited by Mangey Ram and J. Paulo Davim.

by Davim, J. Paulo [editor.] | Ram, Mangey [editor.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available

Food packaging materials : testing & quality assurance / edited by Preeti Singh, Ali Abas Wani, Horst-Christian Langowski.

by Singh, Preeti (Materials scientist) [editor.] | Wani, Ali Abas [editor.] | Langowski, Horst-Christian [editor.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Online access: Click here to view. Availability: No items available

Reliability Engineering : Theory and Applications / edited by Ilia Vonta and Mangey Ram.

by Vonta, Ilia [editor.] | Ram, Mangey [editor.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available

Robust design for quality engineering and Six Sigma [electronic resource] / Sung H. Park, Jiju Antony.

by Park, Sung H | Antony, Jiju.

Material type: computer file Computer file; Format: electronic available online remote Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2008Online access: Access to full text is restricted to subscribers. Availability: No items available

Journey to data quality / Yang W. Lee ... [et al.].

by Lee, Yang W | IEEE Xplore (Online Service) [distributor.] | MIT Press [publisher.].

Material type: book Book; Format: available online remote Publisher: Cambridge, Massachusetts : MIT Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available

Signal processing of power quality disturbances / Math H.J. Bollen, Irene Yu-Hua Gu.

by Bollen, Math H. J [author.] | Gu, Irene Yu-Hua | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.].

Material type: book Book; Format: available online remote Publisher: Hoboken, New Jersey : Wiley-Interscience, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available

Optical bit error rate : an estimation methodology / Stamatios V. Kartalopoulos.

by Kartalopoulos, Stamatios V [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2004Distributor: [Piscataqay, New Jersey] : IEEE Xplore, 2004Online access: Abstract with links to resource Availability: No items available