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Optical bit error rate : an estimation methodology / Stamatios V. Kartalopoulos.

by Kartalopoulos, Stamatios V [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2004Distributor: [Piscataqay, New Jersey] : IEEE Xplore, 2004Online access: Abstract with links to resource Availability: No items available

Spatial error analysis : a unified, application-oriented treatment / David Y. Hsu.

by Hsu, David Y, 1945- | John Wiley & Sons [publisher.] | IEEE Aerospace and Electronic Systems Society | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote Publisher: New York : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available

Error estimation for pattern recognition / Ulisses M. Braga Neto, Edward R. Dougherty.

by Braga-Neto, Ulisses de Mendon A�Aca [author.] | Dougherty, Edward R [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].

Material type: book Book; Format: available online remote Publisher: Chichester, West Sussex : Wiley Blackwell, 2015Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2015]Online access: Abstract with links to resource Availability: No items available