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Dynamic Localization Phenomena in Elasticity, Acoustics and Electromagnetism [electronic resource] / edited by Richard V. Craster, Julius Kaplunov.

Contributor(s): Craster, Richard V [editor.] | Kaplunov, Julius [editor.] | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: CISM International Centre for Mechanical Sciences: 547Publisher: Vienna : Springer Vienna : Imprint: Springer, 2013Edition: 1.Description: VII, 256 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783709116197.Subject(s): Engineering | Applied mathematics | Engineering mathematics | Mechanics | Acoustics | Optics | Electrodynamics | Continuum mechanics | Structural materials | Engineering | Continuum Mechanics and Mechanics of Materials | Structural Materials | Applications of Mathematics | Mechanics | Optics and Electrodynamics | AcousticsAdditional physical formats: Printed edition:: No titleDDC classification: 620.1 Online resources: Click here to access online
Contents:
Modeling microstructured media: periodic systems and effective media -- Multiscale models of electromagnetic and plasmonic metamaterials -- Explicit models for surface, interfacial and edge elastic wave -- Elastodynamic end effects in structural mechanics -- Trapped modes and edge resonances in acoustics and elasticity -- Surface waves in elastic half spaces coated with crystalline films.
In: Springer eBooksSummary: Properties of wave localization play a decisive role both in  applications of engineered microstructures and in the detection of cracks and flaws. The papers in this volume give an introduction into a variety of interrelated dynamic localization phenomena occurring in elasticity, acoustics and electromagnetism. In particular, these involve surface and edge waves and also trapped modes localized near defects, shape changes and the edges of elongated waveguides. The effects of layering, prestress, anisotropy, periodic microstructures as well as various multi-field phenomena are addressed with reference to underlying industrial problems.  The essential and up-to-date numerical, asymptotic, and analytical techniques are covered as well as relevant continuum theories that are required to make progress in, and understand wave localization and allied effects. A major focus is on a qualitative physical insight into the mechanisms of dynamic localization.
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Modeling microstructured media: periodic systems and effective media -- Multiscale models of electromagnetic and plasmonic metamaterials -- Explicit models for surface, interfacial and edge elastic wave -- Elastodynamic end effects in structural mechanics -- Trapped modes and edge resonances in acoustics and elasticity -- Surface waves in elastic half spaces coated with crystalline films.

Properties of wave localization play a decisive role both in  applications of engineered microstructures and in the detection of cracks and flaws. The papers in this volume give an introduction into a variety of interrelated dynamic localization phenomena occurring in elasticity, acoustics and electromagnetism. In particular, these involve surface and edge waves and also trapped modes localized near defects, shape changes and the edges of elongated waveguides. The effects of layering, prestress, anisotropy, periodic microstructures as well as various multi-field phenomena are addressed with reference to underlying industrial problems.  The essential and up-to-date numerical, asymptotic, and analytical techniques are covered as well as relevant continuum theories that are required to make progress in, and understand wave localization and allied effects. A major focus is on a qualitative physical insight into the mechanisms of dynamic localization.

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