Optical Characterization of Epitaxial Semiconductor Layers
By: Bauer, Günther | Richter, Wolfgang.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Call number | Status | Date due | Barcode |
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CENTRAL LIBRARY | 621.382 B337 (Browse shelf) | Available | 060640 |
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