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Imaging Spectroscopy for Scene Analysis [electronic resource] / by Antonio Robles-Kelly, Cong Phuoc Huynh.
by Robles-Kelly, Antonio [author.] | Huynh, Cong Phuoc [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type:  Book; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: London : Springer London : Imprint: Springer, 2013Online access: Click here to access online Availability: No items available
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Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, S+SSPR 2016, M�erida, Mexico, November 29 - December 2, 2016, Proceedings / edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson.
by Robles-Kelly, Antonio [editor.] | Loog, Marco [editor.] | Biggio, Battista [editor.] | Escolano, Francisco [editor.] | Wilson, Richard [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available
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Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings / edited by Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly.
by Bai, Xiao [editor.] | Hancock, Edwin R [editor.] | Ho, Tin Kam [editor.] | Wilson, Richard C [editor.] | Biggio, Battista [editor.] | Robles-Kelly, Antonio [editor.] | SpringerLink (Online service). Edition: 1st ed. 2018.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2018Online access: Click here to access online Availability: No items available
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Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings / edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson.
by Robles-Kelly, Antonio [editor.] | Loog, Marco [editor.] | Biggio, Battista [editor.] | Escolano, Francisco [editor.] | Wilson, Richard [editor.] | SpringerLink (Online service). Edition: 1st ed. 2016.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available
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Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings / edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly.
by Torsello, Andrea [editor.] | Rossi, Luca [editor.] | Pelillo, Marcello [editor.] | Biggio, Battista [editor.] | Robles-Kelly, Antonio [editor.] | SpringerLink (Online service). Edition: 1st ed. 2021.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2021Online access: Click here to access online Availability: No items available
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