Central Library

Your search returned 4 results. Subscribe to this search

Unhighlight Highlight
|
Soft Error Mechanisms, Modeling and Mitigation [electronic resource] / by Selahattin Sayil.

by Sayil, Selahattin [author.] | SpringerLink (Online service).

Edition: 1st ed. 2016.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available

Contactless VLSI Measurement and Testing Techniques [electronic resource] / by Selahattin Sayil.

by Sayil, Selahattin [author.] | SpringerLink (Online service).

Edition: 1st ed. 2018.Source: Springer Nature eBookMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2018Online access: Click here to access online Availability: No items available

Soft Error Mechanisms, Modeling and Mitigation [electronic resource] / by Selahattin Sayil.

by Sayil, Selahattin [author.] | SpringerLink (Online service).

Edition: 1st ed. 2016.Source: Springer Nature eBookMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available

Noise Contamination in Nanoscale VLSI Circuits [electronic resource] / by Selahattin Sayil.

by Sayil, Selahattin [author.] | SpringerLink (Online service).

Edition: 1st ed. 2022.Source: Springer Nature eBookMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2022Online access: Click here to access online Availability: No items available