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Diagnostics and Reliability of Pipeline Systems [electronic resource] / by Sviatoslav Timashev, Anna Bushinskaya.

by Timashev, Sviatoslav [author.] | Bushinskaya, Anna [author.] | SpringerLink (Online service).

Edition: 1st ed. 2016.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available

Solving the Dynamic Complexity Dilemma [electronic resource] : Predictive and Prescriptive Business Management: Answering the Need for a New Paradigm / by Nabil Abu el Ata, Maurice J. Perks.

by Abu el Ata, Nabil [author.] | Perks, Maurice J [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014Online access: Click here to access online Availability: No items available

Automated defect prevention : best practices in software management / Dorota Huizinga, Adam Kolawa.

by Huizinga, Dorota [author.] | Kolawa, Adam | IEEE Xplore (Online Service) [distributor.] | Wiley InterScience (Online service) [publisher.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, New Jersey : Wiley-Interscience : c2007Online access: Abstract with links to resource Availability: No items available

Software testing : testing across the entire software development life cycle / Gerald D. Everett, Raymond McLeod, Jr.

by Everett, Gerald D, 1943- [author.] | McLeod, Raymond | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: [Piscataway, New Jersey] : IEEE Press, c2007Online access: Abstract with links to resource Availability: No items available

Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.

by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available

Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

by Abramovici, Miron [author.] | Breuer, Melvin A | Friedman, Arthur D | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available

Integrated circuit manufacturability : the art of process and design integration / edited by Jos�e Pineda de Gyvez, Dhiraj Pradhan.

by Pradhan, Dhiraj K | Pineda de Gyvez, Jos�e | John Wiley & Sons [publisher.] | IEEE Circuits and Systems Society | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available

Semiconductor material and device characterization / Dieter K. Schroder.

by Schroder, Dieter K [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Edition: 3rd ed.Material type: book Book; Format: available online remote Publisher: [Piscataway, New Jersey] : IEEE Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available

Software quality engineering : testing, quality assurance, and quantifiable improvement / Jeff Tian.

by Tian, Jeff [author.] | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.].

Material type: book Book; Format: available online remote Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available

RF measurements for cellular phones and wireless data systems / Allan W. Scott, Rex Frobenius.

by Scott, Allan W [author.] | Frobenius, Rex | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, New Jersey : IEEE, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2008]Online access: Abstract with links to resource Availability: No items available

Ultrasonic inspection technology development and search units design : examples of practical applications / by Mark V. Brook.

by Brook, Mark V [author.] | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.].

Material type: book Book; Format: available online remote Publisher: [Hoboken, New Jersey] : Wiley, c2012Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]Online access: Abstract with links to resource Availability: No items available

Verification of communication protocols in web services : model-checking service compositions / Zahir Tari, Peter Bertok, Anshuman Mukherjee, RMIT University.

by Tari, Zahir [author.] | Bert�ok, P�eter, 1952- | Mukherjee, Anshuman | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].

Material type: book Book; Format: available online remote Publisher: Hoboken, New Jersey : Wiley, [2014]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2013]Online access: Abstract with links to resource Availability: No items available

Software quality engineering : Testing, quality assurance, and quantifiable improvement / Jeff Tian.

by Tian, Jeff [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].

Material type: book Book; Format: available online remote Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2014]Online access: Abstract with links to resource Availability: No items available

Perspectives on big data analysis : [electronic resource] methodologies and applications : International Workshop on Perspectives on High-Dimension Data Anlaysis II, May 30-June 1, 2012, Centre de recherches math�ematiques, University de Montr�eal, Montr�eal, Qu�ebec, Canada / S. Ejaz Ahmed, editor.

by International Workshop on Perspectives on High-Dimension Data Anlaysis (2nd : 2012 : Montr�eal, Qu�ebec) | Ahmed, S. E. (Syed Ejaz), 1957- [editor of compilation.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Providence, Rhode Island : American Mathematical Society, 2014Online access: Contents | Contents Availability: No items available

Catalog of worldwide nuclear testing [electronic resource] / V.N. Mikhailov, editor-in-chief.

by Mikha�ilov, V. N. (Viktor Nikitovich) | Begell House, Inc.

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York, N.Y. : Begell-Atom, c1999; Redding, Conn. : Begell House, Inc. (50 Cross Highway, Redding, CT 06896) Online access: Begell House Availability: No items available

Microwave and wireless measurement techniques / Nuno Borges Carvalho, Universidade de Aveiro, Dominique Schreurs, KU Leuven, Belgium.

by Carvalho, Nuno Borges [author.] | Schreurs, Dominique [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Cambridge : Cambridge University Press, 2013Other title: Microwave & Wireless Measurement Techniques.Online access: Click here to access online Availability: No items available

Analytic methods in systems and software testing / edited by Ron S. Kenett, KPA, Raanana, Israel and Neaman Institute, Technion, Israel, Fabrizio Ruggeri, CNR-IMATI, Italy, Frederick W. Faltin, the Faltin Group, and Virginia Tech, USA.

by Kenett, Ron [editor.] | Ruggeri, Fabrizio [editor.] | Faltin, Frederick W [editor.].

Edition: 1 edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, NJ, USA : John Wiley & Sons, Inc., 2018Copyright date: ©2018Online access: Wiley Online Library Availability: No items available

Composite structures : effects of defects / Rani Elhajjar, University of Wisconsin, Milwaukee, Wisconsin, Peter Grant, Independent Aviation & Aerospace Professional, Medford, Oregon, Cindy Ashforth, Federal Aviation Administration, Seattle, Washington.

by Elhajjar, Rani [author.] | Grant, Peter, 1942- [author.] | Ashforth, Cindy [author.].

Edition: First edition.Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, Ltd, 2019Online access: Wiley Online Library Availability: No items available

Steel connection analysis / Paolo Rugarli.

by Rugarli, Paolo, 1963- [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, NJ : John Wiley & Sons, Inc., 2018Copyright date: ©2018Online access: Wiley Online Library Availability: No items available

Reliability prediction and testing textbook / Lev M. Klyatis ; Edward L. Anderson.

by Klyatis, Lev M [author.] | Anderson, Edward, 1945- [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Hoboken, NJ, USA : John Wiley & Sons, Inc., 2018Copyright date: ©2018Online access: Wiley Online Library Availability: No items available